Go to content Go to the menu Go to the search

International workshop HRDP6

Quick access, personalized services


Advanced search

International Workshop HRDP6

The purpose of the workshop is to provide a fertile forum for exchange of ideas, discussion of problems and presentation of new results in the field of Low and Medium Energy Ion Scattering, Rutherford Backscattering Spectrometry and Elastic Recoil Energy Analysis with sub-nanometric depth resolution, Narrow Nuclear Resonance profiling and Secondary Ion Mass Spectrometry, as well as surface and interface structure determinations using ion beams. Contributions are also solicited from related fields that have an impact on, or that can be impacted by, the topics above. The Workshop is concerned with both development of the underlying methodology, including fundamental ion-solid interactions, and applications of high resolution depth profiling in areas such as nano-technology, semiconductor device development, surface and interface characterization at the atomic scale, and study of thin film growth processes. Both theoretical and experimental contributions are welcomed. The workshop follows five highly successful workshops held in Abingdon (UK - 2000), Kyungju (Korea - 2002), Bar Harbor (USA - 2005), Radebeul (Germany - 2007) and Kyoto (Japan - 2009). The meeting will consist of invited lectures, and contributed oral and poster contributions, with opportunities for early career researchers and doctoral students to present their work.


HRDP6 websiteNouvelle fenêtre.